Having trouble reading this email? View it in your browser. Not interested anymore? Unsubscribe Instantly.

X-ES ENews: BIT
Quick Links
Product Finder

BIT Product Brief

Design Services

Contact X-ES
Contact Us!

Follow XES_INC on Twitter

Upcoming Events
06.21.11 - MILESTONE Baltimore
06.23.11 - MILESTONE New England
08.
16.11 - AUVSI 2011
11.07.11 - MILCOM2011

About X-ES
Extreme Engineering Solutions, Inc. (X-ES) designs and builds chassis, single-board computers, I/O, power, backplanes, system-level and custom products within the embedded computer industry. X-ES offers cutting-edge performance and flexibility in design, plus an unparalleled level of customer support and service. Please contact X-ES sales if you have any questions.

ISO 9001:2008 Registered  OpenVPX
Built-In Test (BIT) is a critical aspect of system reliability and maintainability. BIT support provides our customers with the capability to quickly detect, isolate, and determine the root cause of a potential problem within their system. Through the use of X-ES BIT, system reliability, maintainability, and operational availability can be improved. X-ES BIT is an open, extensible test platform that developers can incorporate into their system design to reduce the amount of development they need to do in order to meet their testing and diagnostic requirements.

What makes X-ES BIT Best In Class?
  • Free with all current X-ES Intel and Freescale SBC’s
  • BIT covers all of the major SBC functional blocks
  • Standardized API across architectures and operating systems
  • Written in ANSI C, licensed source code is included
  • X-ES BIT supports Power-On BIT (PBIT),also known as Power-On Self Test (POST), Continuous BIT (CBIT), and Initiated BIT (IBIT)
The X-ES BIT software suite is provided in ANSI C source form and presents the user with the same consistent Application Programming Interface (API) for every X-ES product over every supported operating system. For example, all Intel- and Freescale-based X-ES processor cards support a common set of BIT tests for common device interfaces such as SDRAM, Ethernet, and non-volatile storage.

X-ES provides BIT code that covers all the major functional blocks of a design. A BIT device coverage map is available with all X-ES products (see example BIT device coverage map below).  Additional FDFI (Fault Detection and Fault Isolation) analysis reports are available upon request.



Types of BIT
Power-on BIT: Executed by the boot software. Typically these tests are executed in the BIOS for Intel-based products, and in U-Boot for Freescale-based products. The results of PBIT are stored and can be retrieved via API from the operating system.
Continuous BIT: Executed from a task within the operating system. This task periodically runs noninvasive tests such as ECC and device error condition checks. Callback routines or periodic polling can be utilized to alert applications of CBIT failures.
Initiated BIT: Executed at any time from the end application. Initiated BIT consists of both nondestructive and destructive testing. Non-destructive tests, such as reading the number of single-bit ECC errors, can be used in place of CBIT for periodic checking of system health. Destructive tests, such as an internal Ethernet loopback, can be utilized to help diagnose the origin of system failures.

Whether your goals are Fault Detection and Fault Isolation (FDFI) coverage during deployment, qualification testing, or manufacturing reliability, X-ES has the BIT capabilities your project needs.
Extreme Engineering Solutions, Inc
3225 Deming Way, Suite 120, Middleton, WI 53562
+1-608.833.1155 | xes-inc.com | sales@xes-inc.com

We send news updates to loyal friends and customers. Unsubscribe <<Email Address>> from this list.
Copyright (C) 2009 Extreme Engineering Solutions, Inc. All rights reserved.

Forward this email to a friend Update your profile